Coordonnées
mariam-melhem@hotmail.com
Doctorat
Intitulé : Automatique
1ère inscription en thèse :
Décembre 2013
École doctorale :
Mathématiques et Informatique de Marseille
Date de soutenance de la thèse :
20 Novembre 2017
Sujet :
Développement des méthodes génériques d'analyses multi-variées pour la surveillance de la qualité du produit
Directeur de thèse :
Mustapha OULADSINE
Co-directeur :
Bouchra ANANOU
Unité de recherche :
LIS Laboratoire d'Informatique et Systèmes
Intitulé de l'équipe :
Master
Intitulé : Mathématiques Appliqués
Octobre 2013 - Aix-Marseille université
Langues vivantes
Anglais : C2 - Courant
Français : C2 - Courant
Arabe : C2 - Maternel
Production scientifique
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Prediction of the Wafer quality with respect to the production equipments data
IFAC Symposium on Fault Detection, Supervision (SAFEPROCESS), IFAC, Paris, France
2015
Mariam MELHEM - Bouchra ANANOU - Mohand DJEZIRI - Mustapha OULADSINE - Jacques PINATON
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Product's Quality Prediction with respect to equipments Data
2015 International Conference on Data Mining (DMIN'15), Las Vegas, Nevada, USA
2015
Mariam MELHEM - Bouchra ANANOU - Mohand DJEZIRI - Mustapha OULADSINE - Jacques PINATON
http://worldcomp-proceedings.com/proc/p2015/DMIN_contents.html
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Pronostic de la qualité dun produit dans lindustrie de production: Application à lindustrie de semi-conducteurs
6èmes Journées Doctorales / Journées Nationales MACS, INSA Centre - Val de Loire, Campus de BOURGES
2015
Mariam MELHEM - Bouchra ANANOU - Mohand DJEZIRI - Mustapha OULADSINE - Jacques PINATON
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Regularized Regression Models to Predict the Product Quality in Multistep Manufacturing
5th International Conference on Systems and Control. IEEE
2016
Mariam Melhem, Bouchra ananou, Mustapha Ouladsine, and Jacques Pinaton
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Regression Methods for Predicting the Products Quality in the Semiconductor Manufacturing Process
8th IFAC Conference on Manufacturing Modelling, Management and Control MIM 2016
2016
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, and Jacques Pinaton
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Prediction of the Wafer quality with respect to the equipments quality
9th IFAC Symposium on Fault Detection, Supervision and Safety for Technical Processes SAFEPROCESS'15
2016
Mariam MELHEM, LSIS Bouchra ANANOU, LSIS Mustapha Ouladsine, LSIS Jacques Pinaton, STmicroelectronics
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Regression methods for predicting the product's quality in the semiconductor manufacturing process
2016
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
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8th IFAC Conference on Manufacturing Modelling, Management and Control
2016
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
-
Regularized regression models to predict the product quality in multistep manufacturing
2016
Mariam Melhem, Bouchra Ananou, Mustapha Ouladsine, Jacques Pinaton
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Product quality prediction using alarm data: Application to the semiconductor manufacturing process.
25th Mediterranean Conference on Control and Automation (MED)
2017
Melhem, M., Ananou, B., Ouladsine, M., Combal, M., & Pinaton, J.
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Analysis of similarities between alarm events in the semiconductor manufacturing process
25th Mediterranean Conference on Control and Automation (MED)
2017
Melhem, M., Ananou, B., Ouladsine, M., Combal, M., & Pinaton, J.
