Monsieur Tarek SAAD SAOUD / Docteur

Production scientifique

• Behavioral Modeling of SRIM Tables for Numerical Simulation
  NIM.B, 2014
  S. Martinie1, T. Saad Saoud, S. Moindje, D. Munteanu, J.L. Autran
  http://www.sciencedirect.com/science/article/pii/S0168583X13011920#
  
• Use of CCD to Detect Terrestrial Cosmic Rays at Ground Level: Altitude vs. Underground Experiments, Modeling and Numerical Monte Carlo Simulation
  IEEE, 2015
  T. Saad Saoud, S. Moindjie, J.L. Autran, D. Munteanu, F. Wrobel, F. Saigné, P. Cocquerez, L. Dilillo
  http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=6954525&url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel7%2F23%2F6976033%2F06954525.pdf%3Farnumber%3D6954525
  
• ASTEP (2005–2015): Ten years of soft error and atmospheric radiation characterization on the Plateau de Bure
  Microelectronics Reliability, 2015
  J.L. Autran, D.Munteanua, S. Moindjie, T. Saad Saoud, S. Sauze. Gasiot, P. Roche
  
  
• Charge Collection Physical Modeling for Soft Error Rate Computational Simulation in Digital Circuits
  Modeling and Simulation in Engineering Sciences, 2016
  Jean-Luc Autran, Daniela Munteanu, Soilihi Moindjie, Tarek Saad Saoud, Victor Malherbe, Gilles Gasiot, Sylvain Clerc and Philippe Roche
  http://www.intechopen.com/books/modeling-and-simulation-in-engineering-sciences/charge-collection-physical-modeling-for-soft-error-rate-computational-simulation-in-digital-circuits
  
• Natural radiation events in CCD imagers at ground level
  Microelectronics Reliability, 2016
  T. Saad Saoud, S. Moindjie, D. Munteanu, J.L. Autran
  
  
• Natural Radiation Effects in CCD devices
  Ionizing Radiation Effects in Electronics: From Memories to Imagers, 2015
  T. Saad Saoud, S. Moindjie, D. Munteanu, J.L. Autran
  
  
• Characterization of Atmospheric Muons at Sea Level using a Cosmic-Ray Telescope
  Microelectronics Reliability, 2016
  T.Saad Saoud, S. Moindjie, J.L. Autran, D. Munteanu, V. Malherbe, G. Gasiot, P. Roche